| function test = thdnf_test_measure(test) |
| |
| %% |
| % Copyright (c) 2017, Intel Corporation |
| % All rights reserved. |
| % |
| % Redistribution and use in source and binary forms, with or without |
| % modification, are permitted provided that the following conditions are met: |
| % * Redistributions of source code must retain the above copyright |
| % notice, this list of conditions and the following disclaimer. |
| % * Redistributions in binary form must reproduce the above copyright |
| % notice, this list of conditions and the following disclaimer in the |
| % documentation and/or other materials provided with the distribution. |
| % * Neither the name of the Intel Corporation nor the |
| % names of its contributors may be used to endorse or promote products |
| % derived from this software without specific prior written permission. |
| % |
| % THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS "AS IS" |
| % AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE |
| % IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE |
| % ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT OWNER OR CONTRIBUTORS BE |
| % LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR |
| % CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF |
| % SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS |
| % INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN |
| % CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) |
| % ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE |
| % POSSIBILITY OF SUCH DAMAGE. |
| % |
| % Author: Seppo Ingalsuo <seppo.ingalsuo@linux.intel.com> |
| % |
| |
| %% Reference: AES17 6.3.2 THD+N ratio vs frequency |
| % http://www.aes.org/publications/standards/ |
| |
| %% Load output file |
| [x, nx] = load_test_output(test); |
| if nx == 0 |
| test.g_db = NaN; |
| test.fail = 1; |
| return |
| end |
| |
| %% Standard low-pass |
| y0 = stdlpf(x, test.fu, test.fs); |
| |
| %% Find sync |
| [d, nt, nt_use, nt_skip] = find_test_signal(y0, test); |
| |
| %% Measure all test frequencies |
| ml = zeros(test.nf,test.na); |
| mn = zeros(test.nf,test.na); |
| n_notch_settle = round(test.fs*test.nst); |
| nn = 1; |
| for m=1:test.na |
| for n=1:test.nf |
| fprintf('Measuring %.0f Hz ...\n', test.f(n)); |
| i1 = d+(nn-1)*nt+nt_skip; |
| i2 = i1+nt_use-1; |
| nn = nn+1; |
| y0n = stdnotch(y0(i1:i2), test.f(n), test.fs); |
| ml(n,m) = level_dbfs(y0(i1:i2)); |
| mn(n,m) = level_dbfs(y0n(n_notch_settle:end)); |
| end |
| end |
| |
| test.thdnf = mn - ml; |
| test.thdnf_high = test.thdnf(:,1); |
| test.thdnf_low = test.thdnf(:,2); |
| if max(max(test.thdnf)) > test.thdnf_max |
| test.fail = 1; |
| else |
| test.fail = 0; |
| end |
| |
| test.fh = figure('visible', test.visible); |
| semilogx(test.f, test.thdnf(:,1), 'b', test.f, test.thdnf(:,2), 'g--'); |
| grid on; |
| xlabel('Frequency (Hz)'); |
| ylabel('THD+N (dB)'); |
| legend('-1 dBFS','-20 dBFS'); |
| |
| end |