| #! /bin/bash |
| # SPDX-License-Identifier: GPL-2.0 |
| # Copyright (c) 2013 Samsung Electronics. All Rights Reserved. |
| # |
| # FS QA Test No. generic/022 |
| # |
| # Delayed allocation collapse range tests |
| # This testcase is one of the 4 testcases which tries to |
| # test various corner cases for fcollapse range functionality over different |
| # type of extents. These tests are based on generic/255 test case. |
| # For the type of tests, check the description of _test_generic_punch |
| # in common/rc. |
| . ./common/preamble |
| _begin_fstest auto quick prealloc punch collapse |
| |
| # Import common functions. |
| # we need to include common/punch to get defination fo filter functions |
| . ./common/filter |
| . ./common/punch |
| |
| # real QA test starts here |
| _supported_fs generic |
| |
| _require_test |
| _require_xfs_io_command "fpunch" |
| _require_xfs_io_command "falloc" |
| _require_xfs_io_command "fiemap" |
| _require_xfs_io_command "fcollapse" |
| |
| testfile=$TEST_DIR/$seq.$$ |
| |
| _test_generic_punch -d falloc fpunch fcollapse fiemap _filter_hole_fiemap $testfile |
| _check_test_fs |
| |
| status=0 |
| exit |
